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仪器描述参考:
Raman spectra were recorded with a confocal Raman microscope WITec alpha300 (WITec GmbH, Ulm, Germany) using implemented Zeiss objectives (50× NA = 0.55; 50× NA = 0.8; 10× NA = 0.25). The excitation wavelength of the Nd:YAG laser was 532 nm actuated at 10 mW. Signals were detected by a back-illuminated CCD camera after passing a 50-μm pinhole. The spectral resolution was 4 cm−1. The wafer image had a pixel resolution of 2 × 2 μm. Integration time for each Raman spectrum acquisition was 0.2 s. Raman spectra were recorded every 5 μm along the *x* and *y*-axis for the extrudate cross section and exterior surface integrated at 0.1 and 0.5 s, respectively. Two thousand five hundred Raman spectra were collected from the investigated area of 2,000 × 2,000 μm at an integration time of 0.6 s. The collected Raman spectra were processed and converted #### false color images using the software WITec Project Plus (WITec GmbH, Ulm, Germany).
拉曼光谱使用配备蔡司物镜(50倍,数值孔径NA=0.55;50倍,NA=0.8;10倍,NA=0.25)的共聚焦拉曼显微镜WITec alpha300(德国乌尔姆WITec公司)进行采集。Nd:YAG激光器的激发波长为532 nm,功率设置为10 mW。信号经50 μm针孔过滤后,由背照式CCD相机检测,光谱分辨率为4 cm⁻¹。样品成像的像素分辨率为2×2 μm。
数据采集参数
单次拉曼光谱积分时间:0.2秒;
扫描步长:沿X轴和Y轴每5 μm采集一次;
挤出物横截面:单点积分时间0.1秒;
外表面:单点积分时间0.5秒;
总采集区域:2000×2000 μm²,积分时间0.6秒,共采集2500个拉曼光谱。
采集的拉曼光谱通过WITec Project Plus软件(德国乌尔姆WITec公司)处理并转换为伪彩色图像。